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CAP CER 0.018UF 16V X7R 0805
CAP CER 2700PF 63V C0G/NP0 1206
IC SRAM 18MBIT PARALLEL 165TFBGA
TEST SOCKET SEB 2610 YG 4MM TEST
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| 类型 | 描述 |
|---|---|
| 系列: | - |
| 包裹: | Tray |
| 零件状态: | Obsolete |
| 内存类型: | Volatile |
| 内存格式: | SRAM |
| 技术: | SRAM - Synchronous, SDR |
| 内存大小: | 18Mb (1M x 18) |
| 内存接口: | Parallel |
| 时钟频率: | 117 MHz |
| 写周期时间 - 字，页: | - |
| 访问时间: | 7.5 ns |
| 电压 - 电源: | 2.375V ~ 2.625V |
| 工作温度: | -40°C ~ 85°C (TA) |
| 安装类型: | Surface Mount |
| 包/箱: | 165-TBGA |
| 供应商设备包: | 165-TFBGA (13x15) |
UNIT2, 22/F., RICHMOND COMM. 香港九龙旺角亚皆老街109号大厦
办公时间：周一至周五，9:00-18:30(GMT+8)
电话: 00852-52612101
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