IC SCAN-TEST-DEV/TXRX 64-LQFP
IC SRAM 16MBIT PAR 54TSOP II
类型 | 描述 |
---|---|
系列: | 74ABTH |
包裹: | Tray |
零件状态: | Active |
逻辑类型: | Scan Test Device With Transceivers And Registers |
电源电压: | 4.5V ~ 5.5V |
位数: | 18 |
工作温度: | -40°C ~ 85°C |
安装类型: | Surface Mount |
包/箱: | 64-LQFP |
供应商设备包: | 64-LQFP (10x10) |
UNIT2, 22/F., RICHMOND COMM. 香港九龙旺角亚皆老街109号大厦
办公时间:周一至周五,9:00-18:30(GMT+8)
电话: 00852-52612101
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