类型 | 描述 |
---|---|
系列: | 74LVT |
包裹: | Tray |
零件状态: | Obsolete |
逻辑类型: | Linking Addressable Scan Ports |
电源电压: | 2.7V ~ 3.6V |
位数: | - |
工作温度: | -40°C ~ 85°C |
安装类型: | Surface Mount |
包/箱: | 64-LFBGA |
供应商设备包: | 64-BGA MICROSTAR (8x8) |
UNIT2, 22/F., RICHMOND COMM. 香港九龙旺角亚皆老街109号大厦
办公时间:周一至周五,9:00-18:30(GMT+8)
电话: 00852-52612101
SN74BCT8240ADWRE4Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
|
SN74FB2033KRCRTexas Instruments |
IC REGISTERED TXRX 8BIT 52-QFP |
|
SY100EL16VAKGRoving Networks / Microchip Technology |
IC RCVR DIFF 3.3/5V 8-MSOP |
|
SY100S336AFCRoving Networks / Microchip Technology |
IC COUNTER/SHIFT REG 24-CERPAC+G |
|
74SSTVF16859NLG8Renesas Electronics America |
IC BUFFER 13-26BIT SSTL 56VFQFPN |
|
SY100S336JCRoving Networks / Microchip Technology |
IC COUNTER/SHIFT REG 28-PLCC |
|
SSTUB32866CHLFRenesas Electronics America |
IC REGIST BUFF 25BIT DDR2 96-BGA |
|
IDT74SSTU32864ABFGRenesas Electronics America |
IC BUFFER 1:1/1:2 96-LFBGA |
|
SSTUF32864BHLFTRenesas Electronics America |
IC REGIST BUFF 25BIT DDR2 96-BGA |
|
SSTVF16859BKLFTRenesas Electronics America |
IC REGISTER BUFF 13-26B 56VFQFPN |
|
SN74ABT8652DLRTexas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
|
SY100EL16VCKCRoving Networks / Microchip Technology |
IC RCVR DIFF 5V/3.3V 8-MSOP |
|
SN74S1052DWRG4Texas Instruments |
IC SCHOTTKY BARRIER DIODE 20SOIC |