ICT SPRING CONTACT TEST PROBE
QDR SRAM, 4MX18, 0.45NS, CMOS, P
IC EEPROM 8KBIT I2C 1MHZ 8SOIC
类型 | 描述 |
---|---|
系列: | TOP075 |
包裹: | Box |
零件状态: | Active |
尖端类型: | Spring Tip - Crown Head, 0.047" (1.20mm) Dia |
连接类型: | - |
长度 - 尖端: | 0.388" (9.85mm) |
总长: | 1.300" (33.00mm) |
颜色: | - |
额定电压: | - |
收视率: | - |
数量: | - |
额定电流(安培): | 3 A |
材质 - 身体: | Phosphor Copper, Gold Plated |
材料 - 尖端: | Steel, Beryllium Copper, Gold Plated |
工作温度: | -55°C ~ 120°C |
UNIT2, 22/F., RICHMOND COMM. 香港九龙旺角亚皆老街109号大厦
办公时间:周一至周五,9:00-18:30(GMT+8)
电话: 00852-52612101
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